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边界扫描测试全自动化的应用研究[硕士毕业论文]

2011年12月19日 发表评论 阅读评论 7,823 次浏览

摘要:
随着微电子技术的发展,传统的测试方法已经很难对复杂电路进行高速有效的测试,而边界扫描技术是一种应用于数字集成电路器件的标准化可测试性设计方法,它提供了对电路板上元件的功能、互连及相互间影响进行测试的一种新方案,极大地方便了系统电路的测试。
边界扫描技术通过在芯片的每个I/O引脚附加一个边界扫描单元实现对电路板上器件焊接故障和板内连接故障的测试。本文通过对边界扫描测试原理和理论的学习研究,以PC机为基础,通过USB 2.0接口,设计实现PC机与边界扫描控制器互连,具备高速数据通信、全自动化测试等特性的电路板故障诊断平台。
本文从硬件、软件两方面考虑,提出了一个良好的测试控制器设计方案,以更有效的提高边界扫描测试自动化速度。在硬件方面,将控制器设计为四个功能模块,分别为USB接口单元、控制和转换器单元、双端口存储器单元、TAP接口单元。在软件方面,最重要的是USB驱动相关设计,因为USB关系着PC机与控制器之间直接的数据传送联系,但是由于我们在硬件选型时选择了Cypress半导体公司的EZ-USB系列芯片,其提供的相关框架大大简化了我们的程序设计。另外,针对目前人们最为关注的互连测试矢量生成算法,提出了一种改进的互连测试抗误判算法,并给出了其相应的证明、分析与编程实现,该算法能同时消除线与(W-A)短路故障和线或(W-O)短路故障的误判现象,且紧凑性指标比同类其它算法要优。
通过软硬件结合设计,配合改进的测试矢量生成算法,大大提高了边界扫描控制器的测试自动化程度。

ABSTRACT:
With the development of the micro-electronics, it is difficult to test the complicated circuit quickly and efficaciously by traditional test method, while boundary scan technology which applies to the digital integrates circuits is an integrated and standardized solution to the test of component-functionality, board interconnection and interaction, which facilitates the debugging of system circuitry.
Boundary-Scan Test (BST) attaches a Boundary-Scan Cell (BSC) to each I/O pin to accomplish the test of soldering and linking chips in PCB. This paper is designed a PC-based test platform, which use USB 2.0 realizes the high-speed data communication between PC and the boundary-scan test controller, with the characteristics of the full-automation test PCB fault diagnosis.
In this paper we proposed a good test controller design from both of the hardware and software aspect to increase the speed of boundary-scan test automation after studying some important kinds of test techniques. In terms of hardware, the controller design for the four functional modules, namely the USB interface unit, control and converter unit, dual-port memory cells, TAP interface unit. While on the software hand, the most important thing is the USB-driven design, because the data communication between PC and the controller is most important, when we chose the Cypress’s EZ-USB series chips, which provided the framework greatly simplifies the design of our procedures. In addition, a kind of improved algorithm for interconnect test was put forward based on the research experience of traditional vector generation algorithm. This algorithm can avoid the phenomenon of aliasing syndrome, minimized the compact index and shortened the test time which compared with other algorithms.
Combined with hardware and software designed to the improved test vector generation algorithm greatly enhanced boundary-scan controller’s automation.

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